Separate Twin Sensor To Measure The Yarn, Roving,Sliver’s Evenness, Imperfection And Hairiness Index
Weetwo evenness tester is a computerized instrument for measuring simultaneously yarn and roving/sliver.
Two independent capacitive sensor for simultaneous testing.
Capacitive principle for mass variation and imperfection
Fault analysis software for easy identification of faultsin the test material
Mass variation diagram for yarns and roving/ sliver bothcan be monitored simultaneously in the display at the time of testing.
TECHNICAL SPECIFICATIONS:
ü Weetwo evenness tester consists of two testing units anda controller CPU.
ü Two independent capacitance based sensors for measuringsimultaneously yarns, roving/ sliver.
ü Separate module to measure yarn hairiness index byoptical method.
ü User friendly software to operate both the testing unitssimultaneously and independently with numerical, graphical reports.
ü Tests the material from 0.007NEC to 150 NEC.
ü Test time can be selected from 1 to 20 minutes
ü Spectrogram analysis software for easy identification ofdefective machine parts.
ü Spectrogram and variance length (VL) curve can beobtained.
SPECIAL FEATURES:
ü Two independent reliable capacitive sensors.
ü Hairiness index module can be attached optionally in this instrument.
ü Automatic cop changer helps to test 10 cops one by one ata time without operator’s influence(optional)
ü Analysis calculation and data storage of measured values can be done by the software.
ü Editor option for customizing reports.
ü Testing speed: 25,50,100,200,400, mtr/min (or) yard/min.
ü Number of slubs can be count in slub yarns
ü Industrial grade computer for reliable operation.
ü Granite table top for easy maintenance and elegant appearance.
ü Self diagnosis software for easy checking of the instrument working.
REPORT PARAMETERS:
MEASURED PARAMETERS:
ü U%: U Normal , U half inert , U inert.
ü CV%: CVm , CV1m, CV3m , CV 50m, CV100m, CV half inert, CVinert.
ü Thin: -30% , -40%, -50%, -60%.
ü Thick: +35% , +50% , +70%, +100%.
ü Neps: +140%, +200%, +280%, +400%.
ü Imperfection
ü Relative count.
ü Index.
ü Hairiness.
ü Sh,sh(1m), sh(3m), sh(10m).
ü h (max,1m), h(min,1m).
STATISTICAL REPORTS:
ü Average, median, standard deviation, CV%.
ü Minimum, maximum, range, 95% confidence limit and USP.
GRAPHICAL REPORT:
ü Mass diagram having normal and cut length.
ü VL curve, 3D-VL-curve.
ü Spectrogram, 3D- Spectrogram.
ü Histogram.